A Superior Method of Eliminating B Mode Dielectric Breakdown Failure in Gate Oxides Utilizing a using Charging Phenomenon

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Veröffentlicht in:Handōtai, Shūseki Kairo Gijutsu Shinpojiumu (43. : 1992 : Tokio) Handōtai, Shūseki Kairo Gijutsu Dai 43kai Shinpojiumu
1. Verfasser: Tominaga, Y. (VerfasserIn)
Weitere Verfasser: Nara, A. (VerfasserIn), Ushikoshi, T. (VerfasserIn), Ajioka, T. (VerfasserIn), Kitabayashi, H. (VerfasserIn)
Pages:43
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1992
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