Combined Studies of Gratings by X-ray Reflectivity, GISAXS, and AFM

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Yan, M. (VerfasserIn)
Weitere Verfasser: Bardeau, J. F. (VerfasserIn), Brotons, G. (VerfasserIn), Metzger, T. (VerfasserIn), Gibaud, A. (VerfasserIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2006
Schlagworte:
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Titel Jahr Verfasser
High-Energy White Synchrotron Radiation As a Source for X-ray Reflectometry: Potential Feasibility 2006 Sakurai, Kenji
Reproducibility and Stability of X-ray Reflectivity Technique: GaAs/AlAs multilaver 2006 Mizusawa, Mari
In-Situ Monitoring of Molecular-Beam Epitaxial Growth of InAs/GaAs(001) Quantum Dots by X-ray Diffraction 2006 Takahası, Masamitu
Soft X-ray MCD Studies on Interfaces in Fe/Si Multilayers 2006 Sugawara, Masaki
Development of X-ray Absorption Microspectroscopy for Nano Spot Analyses of Buried Interfaces 2006 Ishii, Masashi
Synthesis and Characterization of a Thiourea-doped Mesoporous Titanium Dioxide Thin Film 2006 Sonia, S. S.
X-ray Waveguide Phenomenon of Pentacene Thin Film 2006 Hayashi, Kouichi
Interfacial Science of Soft-Materials on the J-PARC Pulsed-Neutron Reflectometer 2006 Torikai, Naoya
GI-SAXS Study of Nanocellular and Nanoporous Polymeric Thin Films 2006 Yokoyama, Hideaki
Growth of Oxygen Adlayer on Ru(0001) with High Energy Supersonic Oxygen Molecular Beam 2006 Takahashi, Shin
Effects of NaI on Structure of a Spin-Coated DMPC Film 2006 Yamada, N. L.
In-situ GI-SAXS on the Self-organization Processes of Fe-based Thin Films 2006 Okuda, Hiroshi
Grazing Incidence X-ray Diffraction of Thin Silicon Overlayers on Insulator at Ultra-Small Incident Angles 2006 Omi, H.
Surface and Interface Structures of the Silsesquioxane-filled Polymer Thim Films 2006 Takahara, Atsushi
Buried Heterostructures Revealed by X-ray Reflectivity Measurements around Bragg Points -Structural Evolution for Measurements and Analysis- 2006 Takeda, Yoshikazu
Structural Study for Ge Nanowires on Si(113) by Grazing Incidence X-ray Scattering 2006 Omote, Kazuhiko
Polarized Total-Reflection Fluorescence X-ray Absorption Fine Structure on the Air-Solution interface 2006 Tanıda, Hajime
A High Angular Resolution in-House Reflectometer for Grazing Measurements -- GISAXS and Reflectivity 2006 Tani, Katsuhiko
Structural and Electrical Study on Interface between Bi4La4-xTi3O12 Thin Film and Silicon Substrate 2006 Kohno, Atsushi
Combined Studies of Gratings by X-ray Reflectivity, GISAXS, and AFM 2006 Yan, M.
Alle Artikel auflisten