Structural Study for Ge Nanowires on Si(113) by Grazing Incidence X-ray Scattering

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Bibliographische Detailangaben
1. Verfasser: Omote, Kazuhiko (VerfasserIn)
Weitere Verfasser: Kawamura, Tomoaki (VerfasserIn), Omi, Hiroo (VerfasserIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2006
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