Nondestructive defect analysis solution using combination of Lock-in IR Thermography and high resolution X-ray CT technology

Nondestructive defect analysis solution using combination of Lock-in IR Thermography and high resolution X-ray CT technology

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Veröffentlicht in:2012 2nd IEEE CPMT Symposium Japan
1. Verfasser: Seimiya, Naoki (VerfasserIn)
Pages:2012 2
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2012
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