Scanning electron microscopy and X-ray microanalysis
Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SE...
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| Weitere Verfasser: | , , , , |
| Format: | UnknownFormat |
| Sprache: | eng |
| Veröffentlicht: |
New York, NY, U.S.A.
Springer
2018
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| Ausgabe: | Fourth edition |
| Schlagworte: | |
| Online Zugang: | Inhaltsverzeichnis Cover Verlags-Info |
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| Zusammenfassung: | Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy |
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| Beschreibung: | Hier auch später erschienene, unveränderte Nachdrucke |
| Beschreibung: | XXIII, 550 Seiten Illustrationen, Diagramme 29 cm |
| ISBN: | 9781493966745 978-1-4939-6674-5 9781493982691 978-1-4939-8269-1 |