Changes of the near-surface chemical composition of the [EMIM]Tf 2 N room temperature ionic liquid under the influence of irradiation

In some applications room temperature Ionic Liquids (RT-ILs) are exposed to different kinds of irradiation. Using the low vapour pressures of RT-ILs, we studied the influence of irradiation on the surface properties under UHV conditions by photoelectron spectroscopy and Metastable Induced Electron S...

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Veröffentlicht in:Deutsche Physikalische Gesellschaft DPG spring meeting of the Condensed Matter Section with the divisions: Biological Physics, Chemical and Polymer Physics, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Semiconductor Physics, Surface Science, Thin Films, Vacuum Science and Technology as well as the working groups: Industry and Business, Physics of Socio-Economic Systems
Weitere Verfasser: Ulbrich, Angela (BerichterstatterIn), Marschewski, Marcel (BerichterstatterIn), Himmerlich, Marcel (BerichterstatterIn), Ahmed, Imad (BerichterstatterIn), Schäfer, Jürgen A. (BerichterstatterIn), Pachomow, Evgenij (BerichterstatterIn), Maus-Friedrichs, Wolfgang (BerichterstatterIn), Höfft, Oliver (BerichterstatterIn), Endres, Frank (BerichterstatterIn), Krischok, Stefan (BerichterstatterIn)
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Sprache:eng
Veröffentlicht: 2009
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Zusammenfassung:In some applications room temperature Ionic Liquids (RT-ILs) are exposed to different kinds of irradiation. Using the low vapour pressures of RT-ILs, we studied the influence of irradiation on the surface properties under UHV conditions by photoelectron spectroscopy and Metastable Induced Electron Spectroscopy. We present the effect of irradiation by electrons and photons with energies ranging from a few eV to several keV on the surface composition of [EMIM]Tf2N and its valence band structure. Our results indicate a strong reduction of the carbon content during keV-electron irradiation as well as other compositional changes. The changes of the film composition are correlated with changes in the valence band structure as a function of irradiation energy. X-ray irradiation with high exposures cause also variations in chemical composition of the [EMIM]Tf2N.
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