Reliability and radiation effects in compound semiconductors

Reliability and radiation effects in compound semiconductors

Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Johnston, Allan (VerfasserIn)
Weitere Verfasser: Johnston, Allan John (BerichterstatterIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: Hackensack u.a. World Scientific 2010
Schlagworte:
Compound semiconductors > Reliability > Effect of radiation on > Verbindungshalbleiter > Zuverlässigkeit > Strahlenschaden
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Beschreibung
Zusammenfassung:Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles.
Literaturangaben
Beschreibung:XII, 363 S.
graph. Darst.
ISBN:981427710X
981-4277-10-X
9789814277105
978-981-4277-10-5