Assigning patents to industries tests of the Yale technology concordance

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Bibliographische Detailangaben
Veröffentlicht in:	Economic systems research
1. Verfasser:	Kortum, Samuel (VerfasserIn)
Weitere Verfasser:	Putnam, Jonathan D. (BerichterstatterIn)
Format:	UnknownFormat
Sprache:	eng
Veröffentlicht:	1997
Schriftenreihe:	Invention input-output analysis
Schlagworte:	Patent > Industrieforschung > Schätztheorie > Theorie > Schätzung > Kanada > Aufsatz in Zeitschrift
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Titel	Jahr	Band
Special issue: virtual laboratories for collaborative input-output analysis	2017	volume 29, number 2 (June 2017)
Special issue: A comparative evaluation of multi-regional input-output databases	2014	26.2014,3
Special issue: Disaster impact and input-output analysis	2014	26.2014,1
Special issue: Global multiregional input-output frameworks	2013	25.2013,1
Special issue: Input-output and water	2011	23.2011,4
Special issue: Tourism studies and input-output analysis	2010	22.2010,4
Special issue: Carbon footprint and input-output analysis	2009	21.2009,3
Special issue: China's growing pains	2008	20.2008,2
Special issue: New developments in productivity analysis within an input-output framework	2007	19.2007,3
Special issue: Economic modeling for disaster impact analysis	2007	19.2007,2
Special issue: The history of input-output analysis, Leontief's path and alternative tracks	2006	18.2006,4
Special issue: Industrial ecology and input-output economics	2004	17.2005,4
Special issue: Biproportional techniques in input-output analysis	2004	16.2004,2
Special issue: Accounting for poverty and income distribution analysis	2003	15.2003,2
Special issue: Systems of innovation : scientific and technological interdependencies	2000	14.2002,4
Special issue: Input-output analysis and classical economic theory	2000	12.2000,2