Quality Assessment of Analog to Digital Converter Chip Using Test Data Set

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Veröffentlicht in:International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (12. : 2022 : Emei) 12th International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE 2022) ; Part 1 of 3
1. Verfasser: Sun, K. (VerfasserIn)
Weitere Verfasser: Fu, J. (VerfasserIn), Zhang, P. (VerfasserIn), Wu, D. (VerfasserIn), Liu, X. (VerfasserIn)
Pages:12
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2023
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