Channeling Study of Proton Irradiation Damage in 3C-SiC

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Nashiyama, I. (VerfasserIn)
Weitere Verfasser: Kobayashi, N. (VerfasserIn), Nishijima, T. (VerfasserIn), Yoshida, S. (VerfasserIn), Sakuma, E. (VerfasserIn), Daimon, H. (VerfasserIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1988
Schlagworte:
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Titel Jahr Verfasser
Buried Insulating Layers in Silicon by Ion Implantation 1988 Stephens, K. G.
X-Ray Production by Channeled Ions 1988 Ohura, M.
Characterization of Trace Elements in Semiconductors using Charged Particles Activiation Analysis 1988 Blondiaux, G.
Redistribution of Ion Implanted Dopants during Silicide Formation 1988 Amano, Jun
Properties of YBa2Cu3O7 Thin Films Prepared by Sputtering and the Influence of lon-Irradiation 1988 Meyer, O.
Search for New Applications of Accelerator-Based Elemental Analysis 1988 Nozaki, Tadashi
Annealing Studies of Mg Implanted InP 1988 Kräutle, Herbert
Large-Tilt-Angle Implantation and its Application to VLSI's 1988 Fuse, G.
Formation of Buried Electrode in Si Substrate by Reduction of Metal-Oxide 1988 Ishikawa, N.
Tungsten Silicide/Silicon Contact Layer Analysis 1988 Inoue, Shin-ichi
Damageless Ion Eching by High Current Low Energy Beam 1988 Yu, Jin-Zhong
Adhesion and CEMS Study of Fast Ion Irradiated Fe-Polymer Interfaces 1988 Ingemarsson, P. A.
Ge Ion Beam Mixing Effects on Ti Silicide Formation 1988 Suzuki, Tadashi
Ion-Beam Etching of Polymer Resist Masks Modified by Ion Implantation 1988 Borzenko, T. B.
14C Measurements with Accelerator Mass Spectrometry -- Performance of the Spectrometer and Some Applications to the Earth Sciences -- 1988 Nakamura, Toshio
Characterization of Epitaxial CdTe on InSb(100) by RF Sputtering using RBS Ion Channeling Technique 1988 Nishibayashi, Yoshiki
Structural Study of Metallic Superlattice Mo-Al by X-Ray Diffraction and Rutherford Backscattering 1988 Izumiya, T.
Some Aspects of Ion Beam Analysis in China 1988 Zhu, S. Y.
Materials Characterization with a He+ Micron Beam 1988 Bakhru, H.
Three Dimensional Material Characterization using SIMS and Digital Ion Imaging 1988 Reed, David A.
Alle Artikel auflisten