Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system

Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system

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Veröffentlicht in:International Conference on Mechanics, Resource and Diagnostics of Materials and Structures (14. : 2020 : Jekaterinburg) Mechanics, resource and diagnostics of materials and structures (MRDMS-2020)
1. Verfasser: Nikul’chenkov, N. N. (VerfasserIn)
Weitere Verfasser: Loginov, A. B. (VerfasserIn), Danilov, S. V. (VerfasserIn), Loginov, B. A. (VerfasserIn)
Pages:2020
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Sprache:eng
Veröffentlicht: 2020
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