| A Method for Estimating the Degradation Pattern of the Contact Resistances of a Connector
|
1983 |
Ishino, Masakazu |
| Development of a High-Temperature, Long-Life Heater (Pana-NK Heater)
|
1983 |
Naruo, Noboru |
| A Simple Estimation of Weibull Two Parameters
|
1983 |
Masuda, Akihiko |
| Thermal Fatigue Life of Micro-Solder Interconnections
|
1983 |
Satoh, Ryohei |
| Combination of Pressure Cooker Test and High Temperature Bias Test for Evaluating Plastic Molded IC
|
1983 |
Ueda, Seiji |
| Evaluation of Fine Resist Pattern for Printed Wiring Board
|
1983 |
Adachi, Kohei |
| RAS Function of a Microcomputer-Based Thyristor Leonard System
|
1983 |
Hosoda, Hiromi |
| Boosting the Reliability of Distributed Digital Instrumentation Control System
|
1983 |
Mizutani, Masamichi |
| Reliability and Problems Consideration of Plastic Packaged IC (Part 3)
|
1983 |
Akimoto, Isao |
| Aluminum Double-Layer Metallization
|
1983 |
Koyama, Hirofumi |
| Reliability Study of Large Rotating Machine Insulation
|
1983 |
Matsunobu, Kenji |
| The Progress of the Reliability Evaluation of Electronic Components During the Last Eight Years in a Private Independent Reliability Laboratory
|
1983 |
Okamoto, Hideo |
| Reliability and the New Mounting Techniques of Portable Video Camera Using Chip Devicies
|
1983 |
Masuda, Toshihisa |
| Power Transistor with High Current Capability in a Transient State
|
1983 |
Inoue, Kiyokazu |
| Reliability of the Hoist Rope and Traction Sheave for Elevators
|
1983 |
Honda, Takenobu |
| Failure Mode Analysis and Corrective Action on Aircraft Engine Instrument Based on Reliability and Monitoring Improvement Program
|
1983 |
Ishikawa, Yasuaki |
| Reliability of Purchased IC
|
1983 |
Osato, Masatoshi |
| Prevention of Tin Proper Whisker Growth and Reliability of Tin Electroplating
|
1983 |
Kawanaka, Ryusuke |
| Degradation Characteristic of Reed Relay Under High Speed Operation
|
1983 |
Nakazima, Katsuya |
| Examination on ESD Simulation Test Method
|
1983 |
Esaki, T. |
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