Evaluation of the Deep Level Defects in ‚the Oxygen Precipitated CZ-Si Crystals by a New Semiquantitative Deep-Level Photoluminescence Technique

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Veröffentlicht in:Handōtai, Shūseki Kairo Gijutsu Shinpojiumu (42. : 1992 : Tokio) Handōtai, Shūseki Kairo Gijutsu Dai 42kai Shinpojiumu
1. Verfasser: Hoshi, R. (VerfasserIn)
Weitere Verfasser: Kitagawara, Y. (VerfasserIn), Takenaka, T. (VerfasserIn)
Pages:42
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1991
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