Temperature Acceleration of C/MOS IC Operating Life

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Veröffentlicht in:Symposium on Reliability and Maintainability (8. : 1978 : Tokio) 9th Symposium on Reliability and Maintainability
1. Verfasser: Oniyama, Hideo (VerfasserIn)
Weitere Verfasser: Azegami, Hideo (VerfasserIn), Isagawa, Masaaki (VerfasserIn)
Pages:9
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1979
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