Evaluation of Gate Oxide Lifetime under Constant-Voltage Stress by Charge-to-breakdown

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Veröffentlicht in:Handōtai-Shūseki-Kairo-Gijutsu-Shinpojiumu (48 : 1995 : Tokio) 48. Handōtai Shuseki Kairo Gijutsu Shinpojiumu Kōen Ronbunshū
1. Verfasser: Eguchi, K. (VerfasserIn)
Weitere Verfasser: Uraoka, Y. (VerfasserIn)
Pages:48
Format: UnknownFormat
Sprache:jpn
Veröffentlicht: 1995
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