| Reliability Prediction Methodologies
|
1990 |
PECHT, Michael |
| Theoretical and Practical Aspects of Drift Reliability vs. Manufacturing Yield Optimization
|
1990 |
STYBLINSKI, M. A. |
| Reliability of Plastic Molded ICs using Copper Wire Ball Bonding
|
1990 |
TSURUMARU, Kazuhiro |
| HAST (Highly Accelerated Temperature & Humidity Stress Test) under Air and Steam
|
1990 |
TOI, Keiko |
| Reliability Estimation Method for an LNG Terminal
|
1990 |
FUJII, Takashi |
| Improvement of the Water Supply Connection in Faucets
|
1990 |
OHTA, Yoshiki |
| On Proximity Between Geometric and Some Discrete Life Distributions
|
1990 |
CHENG, Kan |
| Simplified Confidence Intervals for Weibull Distributed Censored Data
|
1990 |
BENSKI, Claudio |
| The Maximum Likelihood Estimation of Weibull Parameters when a Failure is Suppressed by an Unknown Effect
|
1990 |
ISHIOKA, Tsunenori |
| Software Dependability Evaluation in Space Systems
|
1990 |
VALETTE, Veronique |
| Optimum Test Case Generation for Programs without Loops
|
1990 |
OHBA, Mitsuru |
| Estimator of Reliability and Efficiency of "Machine-Man-Environment - Operation - Maintenance"
|
1990 |
VOLKOV, B. N. |
| Reliability Analysis and Periodic Operation of A Warm Stand - by Redundant System
|
1990 |
SASAKI, Masafumi |
| Strategy for Reliability in the Era of Globalization
|
1990 |
KARATSU, Hajima |
| Redundancy Technique for Minimizing the Expected Loss Caused by Incorrect Outputs
|
1990 |
NAKASHIMA, Kyoichi |
| 4 Reliability, the Key to Success
|
1990 |
SASAOKA, Kenzo |
| Failure Analysis Activity as a Semiconductor User
|
1990 |
NAKAMURA, Atsushi |
| Analysis of Complex System Reliability on the Basis of Fluctuational Thermodynamic Model
|
1990 |
GROZOVSKY, Gennady |
| Testability Analysis Technique for Commercial off the Shelf Designs
|
1990 |
RIES, Mark C. |
| Suggestion of Short Time Thermal Environment Test
|
1990 |
SEKIMOTO, Takashi |
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