| Computer Aided Design for Control and Instrumentation
|
1986 |
Hammond, P. H. |
| Direct Digital Control of Building Energy System
|
1986 |
Coggan, D. A. |
| On-line Roundness Measurement Instrument and It’s Applications
|
1986 |
Jun, Li |
| Some Characteristics of the High Pressure Ionization Vacuum Gauge
|
1986 |
Nishijima, T. |
| Study on the Optical Fiber Displacement Transducer
|
1986 |
Hanan, Zhou |
| A 100.000-Ampere Multichannel Openable-Core Comparator for Heavy Direct Current
|
1986 |
Shiyan, Ren |
| Use of Thin Film Transducers for Measurements on Turbomachines
|
1986 |
Portat, M. |
| Microprofilometer Auger New Material Presentation and Application
|
1986 |
Fay, Jacques |
| A New IC Chip Selection System by Laser Beam
|
1986 |
Kimura, Ichiro |
| A New PID Auto-Tuner Design Based on Correlation Technique
|
1986 |
Hang, CC |
| A Novel Intelligent Alternating Instrument
|
1986 |
Zhengsheng, Fei |
| High Performance Driving Method for Stepping Motor
|
1986 |
Yamada, Shin-ichi |
| Inherent Integration Errors by Partial Discharge Measurements
|
1986 |
Zaengl, W. S. |
| Cubic Spline Fitting and Viewing for Closed Curve in two Dimension
|
1986 |
Shanxi, Deng |
| Case History of Control Implementation in A Juice Processing Facility
|
1986 |
Tyring, Nels A. |
| Sample Systems for Process Analyzers
|
1986 |
Burkland, John |
| A Microprocessor-Based Wall Thickness Gauge
|
1986 |
Kangnan, Qi |
| A Multifunctional Measurement System with Microcontroller
|
1986 |
Junqin, Huang |
| A New Type Laser Centering Interferometer and Evaluation of Centering Accuracy of the Lenses
|
1986 |
Shuguang, Zhang |
| Measuring Plating Thickness with X-Ray Fluorescence
|
1986 |
Lenicky, Igor |
Tag hinzufügen