THE IEEE TC-10 STANDARDS: UPDATE 2019

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Bibliographische Detailangaben
Veröffentlicht in:	IMEKO TC4 International Symposium (23. : 2019 : Xi'an) Electrical and electronic measurements promote industry 4.0
1. Verfasser:	Rapuano, Sergio (VerfasserIn)
Weitere Verfasser:	Vito, Luca De (VerfasserIn), Jendzurski, John (VerfasserIn), Boyer, William B. (VerfasserIn), Tilden, Steven J. (VerfasserIn), Paulter, Nicholas G. Jr. (VerfasserIn)
Pages:	4
Format:	UnknownFormat
Sprache:	eng
Veröffentlicht:	2020
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RESEARCH ON A NEW ACTIVE POWER MEASUREMENT ALGORITHM	2020	Zhu, Meng
INFLUENCE OF FAST FLUCTUATION OF DYNAMIC LOAD CURRENT ON DYNAMIC ERROR OF SMART ELECTRICITY METER	2020	Ma, Shanshan
DISPLACEMENT MEASUREMENTS IN UME OSCILLATING-MAGNET KIBBLE BALANCE	2020	Ahmedov, H.
ANALYSIS OF MV CABLE JOINTS EQUIVALENT IMPEDANCE AND ITS VARIATION VS. TEMPERATURE	2020	Mingotti, Alessandro
UNCERTAINTY IN UNCALIBRATED MICROWAVE RESONANT MEASUREMENTS	2020	Torokhtii, K.
CALIBRATION OF LOCK-IN AMPLIFIERS IN THE LOW-FREQUENCY RANGE	2020	Cultrera, Alessandro
DESIGN OF SMALL CAPACITANCE STANDARDS BASED ON ANALYTICAL AND SIMULATION APPROACHES	2020	Wu, Xiaoyuan
A METHOD FOR DECOMPOSING DYNAMIC LOAD SIGNALS AND ITS APPLICATION	2020	Zheng, Ling
THE DYNAMIC ERROR ANALYSIS OF THE CURRENT TRANSFORMER	2020	Xue, Rui
A METHOD OF CALIBRATING ATE WHILE TEST	2020	Zhou, Houping
AMBIENT MONITORING WSNS WITH HARVESTING-AWARE POWER MANAGEMENT	2020	Crescini, Damiano
THE WHOLE-SYSTEM MODEL OF SMART ELECTRICITY METER	2020	Qiu, Lan
A NEW SIMPLE ECG SIGNAL MODEL	2020	Dolinsky, Pavol
STUDY ON CHARGE STANDARD FOR CALIBRATING PD MEASUREMENT EQUIPMENTS	2020	Liu, Na
CALIBRATION OF CURRENT MEASURING NETWORK FOR WET CONTACT OF LEAKAGE CURRENT TESTER	2020	Ma, Xuefeng
DISCUSSION OF POWER QUALITY METRICS SUITABLE FOR DC POWER DISTRIBUTION AND SMART GRIDS	2020	Mariscotti, Andrea
ELECTRICAL CHARACTERISTICS OF PANTOGRAPH ARCS IN DC RAILWAYS: INFRASTRUCTURE INFLUENCE	2020	Mariscotti, A.
NO OSCILLATOR OUTPUT FREQUENCY COUNTER AUTOMATIC TEST EQUIPMENT	2020	Ze-Xin, Guan
STUDY UPON SPECIFIC ABSORPTION RATE: FAR FIELD SOURCE OUTSIDE AND SUBJECT INSIDE THE BUILDING	2020	Bejenaru, Ovidiu
MICROVOLT JOSEPHSON VOLTAGE STANDARD USING A DUAL-CHANNEL PROGRAMMABLE ARRAY CHIP DEVELOPED AT NIM	2020	Li, Honghui

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