Radiation effects on integrated circuits and systems for space applications
Chapter1: Space and Radiation Environments.- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU.- Chapter3: Single Event Effects Test Methods.- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects.- Chapter5: Microprocessor Test...
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| Format: | UnknownFormat |
| Sprache: | eng |
| Veröffentlicht: |
Cham
Springer
2019
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| Online Zugang: | Inhaltsverzeichnis Inhaltsverzeichnis und Leseprobe |
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Tag hinzufügen | Zusammenfassung: | Chapter1: Space and Radiation Environments.- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU.- Chapter3: Single Event Effects Test Methods.- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects.- Chapter5: Microprocessor Testing.- Chapter6: Fault Injection Methodologies.- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors.- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach.- Chapter9: System Hardening and Real Applications.- Chapter10: Backward Error Recovery in SRAM based FPGA.- Chapter11: Development of a Hardened 150nm Standard Cell library.- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability.- Chapter13: COTS & the NewSpace.- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications – An Example for the Successful Utilization of COTS Technology in Space Projects.- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI.- Chapter16: COTS for Deep Space Missions. |
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| Beschreibung: | IX, 401 Seiten Illustrationen, Diagramme |
| ISBN: | 9783030046590 978-3-030-04659-0 3030046591 3-030-04659-1 9783030046606 3030046605 |