Field guide to interferometric optical testing

Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interfero...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	Goodwin, Eric P. (VerfasserIn)
Weitere Verfasser:	Wyant, James C. (VerfasserIn)
Format:	UnknownFormat
Sprache:	eng
Veröffentlicht:	Bellingham, Wash. SPIE Press 2006
Schriftenreihe:	SPIE field guides 10
Schlagworte:	Optical instruments > Testing > Interferometry > Bibliografie > Optische Messung > Interferometrie > Prüftechnik
Online Zugang:	Inhaltsverzeichnis
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Bestellen

Beschreibung
Zusammenfassung:	Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moiré -- Moiré and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer -- Vertical scanning techniques -- Flat surface testing -- Mirrors : continued -- Windows : continued -- Prisms -- Corner cubes -- Curved surface testing -- Testing curved surfaces-test plate -- Curved surfaces : Twyman-Green -- Curved surfaces : laser-based Fizeau -- Testing lenses or lens systems -- Shack cube interferometer -- Scatterplate interferometer -- Phase-shifting scatterplate interferometer -- Long-wavelength interferometry -- Smartt point diffraction interferometer -- Phase shifting a PDI -- Sommargren diffraction interferometer -- Curved surfaces, VSWLI -- Absolute measurements -- Absolute measurements : flats -- Absolute measurements : spheres -- Asphere testing -- Aspheric surfaces -- Aspheric testing -- Hyperboloid null tests -- Offner null -- Holographic null optics -- CGH basics -- CGH design guidelines -- Non-null tests -- Reverse raytracing -- Sub-Nyquist interferometry -- Long-wavelength interferometry -- Appendices -- Non-Interferometric testing -- Foucault (knife-edge) test -- Ronchi test -- Equation summary -- Bibliography -- Index.
Beschreibung:	Includes bibliographical references and index
Beschreibung:	XII, 100 S. graph. Darst.
ISBN:	0819465100 0-8194-6510-0