NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5 - 7, 1980

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Bibliographische Detailangaben
Weitere Verfasser: Ruthberg, Stanley (BerichterstatterIn), Cohen, Elaine C. (BerichterstatterIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: Washington, DC U.S. Gov. Print. Off. 1982
Schriftenreihe:Semiconductor measurement technology 72
Schlagworte:
Konferenzschrift
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Beschreibung
Beschreibung:Semiconductor Materials and Processes Division, Center for Electronic and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards
This activity was sponsored by Rome Air Development Center ... and National Bureau of Standards
Issued April 1982
Includes bibliographical references
S/N 003-003-02402-3
Item 247 (microfiche)
Beschreibung:VI, 294 S.
Ill., graph. Darst.
4°