Aberration-corrected analytical transmission electron microscopy
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--
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| Format: | UnknownFormat |
| Sprache: | eng |
| Veröffentlicht: |
Chichester
Wiley
2011
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| Schriftenreihe: | RMS-Wiley imprint
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| Schlagworte: | |
| Online Zugang: | Inhaltsverzeichnis Cover |
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| Zusammenfassung: | "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- |
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| Beschreibung: | Literaturangaben |
| Beschreibung: | XV, 280 S., [4] Bl. Ill., graph. Darst. |
| ISBN: | 0470518510 0-470-51851-0 9780470518519 978-0-470-51851-9 |