X-ray optics and microanalysis proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20]
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | , |
| Format: | UnknownFormat |
| Sprache: | eng |
| Veröffentlicht: |
Melville, NYk
American Inst. of Physics
2010
|
| Schriftenreihe: | AIP conference proceedings
1221 |
| Schlagworte: | |
| Online Zugang: | Verlagsangaben Abstracts |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Tag hinzufügen | Zusammenfassung: | Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. |
|---|---|
| Beschreibung: | Sponsoring organizations: Research Center Karlsruhe (FZK)-Program Nuclear |
| Beschreibung: | XIV, 214 S. Ill., graph. Darst. |
| ISBN: | 9780735407640 978-0-7354-0764-0 |