Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposia held April 14 - 16, San Francisco, California, U.S.A. ; [Symposium GG, "Electron Crystallography for Materials Research," was held April 13 - 14 ... and Symposium HH, "Quantitative Characterization of Nanostructured Materials," held April 14 - 16 at the 2009 MRS spring meeting]

Electron crystallography for materials research and quantitative characterization of nanostructured materials symposia held April 14 - 16, San Francisco, California, U.S.A. ; [Symposium GG, "Electron Crystallography for Materials Research," was held April 13 - 14 ... and Symposium HH, "Quantitative Characterization of Nanostructured Materials," held April 14 - 16 at the 2009 MRS spring meeting]

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Bibliographische Detailangaben
Weitere Verfasser: Moeck, Peter (BerichterstatterIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: Warrendale, Pa. MRS 2009
Schriftenreihe:Materials Research Society symposium proceedings 1184
Schlagworte:
Crystallography > Electron microscopy > Nanocrystals > Konferenzschrift > Nanostrukturiertes Material > Elektronendiffraktometrie > Kristallographie
Online Zugang:Inhaltsverzeichnis
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Beschreibung
Beschreibung:VIII, 211 S.
ISBN:9781605111575
978-1-60511-157-5