Simple Methods for Evaluating Junctions in IGBTs

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Veröffentlicht in:International Symposium for Testing and Failure Analysis (48. : 2022 : Pasadena, Calif.) 48th International Symposium for Testing and Failure Analysis (ISTFA 2022) ; Volume 1 of 2
1. Verfasser: Viswanathan, Vignesh (VerfasserIn)
Pages:48
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Sprache:eng
Veröffentlicht: 2023
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