| Some Aspects of Ion Beam Analysis in China
|
1988 |
Zhu, S. Y. |
| Materials Characterization with a He+ Micron Beam
|
1988 |
Bakhru, H. |
| Three Dimensional Material Characterization using SIMS and Digital Ion Imaging
|
1988 |
Reed, David A. |
| Raman Scattering and Photoluminescence Spectra from C+ Ion-Implanted GaAs
|
1988 |
Shigetomi, Shigeru |
| A CMOS A/D Converter on Laser Recrystallized SOI with Controlled Crystal Growth Direction
|
1988 |
Kusunoki, S. |
| Application of Microsectioning Technique using Ion-Beam
|
1988 |
Fuikawa, S. |
| Polycrystallization of Amorphous Si Layers by Ion Implantation and Thermal Annealing
|
1988 |
Takahashi, M. |
| Magnetron Enhanced Reactive Ion Etching by Rotational Magnetic Field
|
1988 |
Kim, Kyungshik |
| Alignment Technology in Focused-Ion-Beam Writing
|
1988 |
Hosono, K. |
| Photomask Repair using Focused Ion Beam Technology
|
1988 |
Onoda, H. |
| Measuring Stoichiometry of Y-Ba-Cu-O by Ion Beam and its Influence to Superconductivity
|
1988 |
Yang, Fujia |
| The Surface Analysis of Aluminum Alloy
|
1988 |
Liu, Y. C. |
| A Study of Surface Performance of E52100 Bearing Steel Coated with Cr, Ti Implanted with N+, Ar+
|
1988 |
Weiyi, Yie |
| Irradiation-Induced Phase Transformation in Austenitic Stainless Steel
|
1988 |
Hayashi, N. |
| Some Experimental Studies on the Bombardment Diffused Coated Layer
|
1988 |
Ying-ming, Luo |
| Ion Beam Induced Dynamic Recoil Mixing
|
1988 |
Padmanabhan, K. R. |
| An Investigation of E52100 Bearing Steel Coated with Ti, Cr Mixed by N* and Ar*
|
1988 |
Zhenzong, Zhan |
| ion Beam Mixing in Boron-Fe System
|
1988 |
Sakamoto, I. |
| The Proton Scanning Microprobe
|
1988 |
Haruyama, Y. |
| High-Resolution PIXE with Crystal Spectrometer and Position Sensitive Proportional Counter
|
1988 |
Hamanaka, H. |
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