A DIT Strategy for Detecting Emerging Faults in RRAMs

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IFIP/IEEE International Conference on Very Large Scale Integration (29. : 2021 : Online) VLSI-SoC: Technology advancement on SoC design
1. Verfasser:	Copetti, Thiago Santos (VerfasserIn)
Weitere Verfasser:	Gemmeke, Tobias (VerfasserIn), Poehls, Leticia Maria Bolzani (VerfasserIn)
Format:	UnknownFormat
Sprache:	eng
Veröffentlicht:	2022
Schlagworte:
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Titel	Jahr	Verfasser
Transformative Hardware Design Following the Model-Driven Architecture Vision	2022	Han, Zhao
A DIT Strategy for Detecting Emerging Faults in RRAMs	2022	Copetti, Thiago Santos
Design of a Reconfigurable Optical Computing Architecture Using Phase Change Material	2022	Zolfaghari, Parya
An Improved Deterministic Stochastic MAC (SC-MAC) for High Power Efficiency Design	2022	Wong, Ming Ming
A egulated Sensing Solution Based on a Self-reference Principle for PCM + OTS Memory Array	2022	Gasquez, J.
A First Approach in Using Super-Steep-Subthreshold-Slope Field-Effect Transistors in Ultra-Low Power Analog Design	2022	Couriol, Matthieu
Low-Overhead Early-Stopping Policies for Efficient Random Forests Inference on Microcontrollers	2022	Daghero, Francesco
Design and Mitigation Techniques of Radiation Induced SEEs on Open-Source Embedded Static RAMS	2022	Azimi, Sarah
On the Efficiency of AdapTTA: An Adaptive Test-Time Augmentation Strategy for Reliable Embedded ConvNets	2022	Mocerino, Luca
FMEA on Critical Systems: A Cross-Layer Approach Based on High-Level Models	2022	Roux, Julie
Exploiting Program Slicing and Instruction Clusterization to Identify the Cause of Faulty Temporal Behaviours at System Level	2022	Bragaglio, Moreno
END-TRUE: Emerging Nanotechnology-Based Double-Throughput True Random Number Generator	2022	Rai, Shubham