Identification of External Defects on Fruits Using Deep Learning

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Veröffentlicht in:IbPRIA (10. : 2022 : Aveiro) Pattern recognition and image analysis
1. Verfasser: Aguiar, Henrique Tavares (VerfasserIn)
Weitere Verfasser: Vasconcelos, Raimundo C. S. (VerfasserIn)
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Sprache:eng
Veröffentlicht: 2022
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