DETC2020-22263 A Two-Stage Multi-Fidelity Design Optimization for K-mer-Based Pattern Recognition (KPR) in Image Processing

DETC2020-22263 A Two-Stage Multi-Fidelity Design Optimization for K-mer-Based Pattern Recognition (KPR) in Image Processing

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Veröffentlicht in:ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (2020 : Online) Proceedings of the ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference - 2020 ; Volume 11, B
1. Verfasser: Yao, Yu-Ta (VerfasserIn)
Weitere Verfasser: Wu, Yu-Wei (VerfasserIn), Lin, Po Ting (VerfasserIn)
Pages:2020
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2020
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