| Reliability Analysis for a Multi-Echelon Repair System
|
1983 |
Narita, Genkichi |
| Reliability of Multi-Processor
|
1983 |
Miyasaka, Itaru |
| Reliability Design for Command Destruct Receiver
|
1983 |
Tsushima, Kazuyoshi |
| Reliability of Electrochemical Device for Timing and Integrating
|
1983 |
Hasegawa, Tomoharu |
| Reliability Management of Purchasing Parts
|
1983 |
Goto, Takayuki |
| An Example of Activities for Improving Quality of Semiconductor Purchasing
|
1983 |
Tsubota, Hideyoshi |
| Reliability Assurance Activities and Control Program for Home Electric Appliances
|
1983 |
Shimano, Takeyoshi |
| Newly Designed Fully Automatic Washing Machine for Improved Reliability
|
1983 |
Ueda, Masami |
| Weibull Parameters Estimation and its Evalution Improvement of Bain's Estimation
|
1983 |
Ishioka, Tunenori |
| Destructive Physical Analysis of Electronic Devices by Their Users as Means to Obtain Better Reliability
|
1983 |
Yoshida, Hiroyuki |
| FMEA Application to Copier System Test
|
1983 |
Kubota, Tetsuro |
| Bias Influence on THB Test Results of C-MOS IC
|
1983 |
Ito, Tatsunori |
| Evaluation Methods for the Moisture Resistance of Plastic Encapsulated ICs
|
1983 |
Tsutsumi, Nobutoyo |
| The Simulation of the Moisture Penetration Phenomena in Plastic Package under On/Off Biased Temperature Humidity Test
|
1983 |
Wakamoto, Setsunobu |
| On Accelerated Life Test of Led and Their Degradation Characteristic of Brightness
|
1983 |
Harada, Tomoshichi |
| New Method of Reliability Evaluation for High Performance Liner ICS
|
1983 |
Nakabayashi, Masakazu |
| An Optimal Replacement Problem for an Semi-Markovlan Deterioration System
|
1983 |
Ohnishi, Masamitsu |
| Some Study on the Managing Softare Maintenance for the Computer User
|
1983 |
Mitsuhashi, Takeshi |
| Reliability of the Automatic Assembly Line (Design of Electric Fan for Automatic Manufacturing)
|
1983 |
Migiyama, Iwao |
| Reliability Control for the Engineering Test Satellite-III Development
|
1983 |
Shimodaira, Masayuki |
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