Examination of Measurement Method of Transient Thermal Impedance for Power Transistor

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Veröffentlicht in:Symposium on Reliability and Maintainability (13. : 1983 : Tokio) 13th Symposium on Reliability and Maintainability
1. Verfasser: Tsuzuki, Yukio (VerfasserIn)
Weitere Verfasser: Yamaoka, Masami (VerfasserIn), Inoue, Kiyokazu (VerfasserIn), Nagahaka, Shuuichi (VerfasserIn)
Pages:13
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Sprache:eng
Veröffentlicht: 1983
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