Venn Diagram-Based Feature Ranking Technique for Key Term Extraction

Venn Diagram-Based Feature Ranking Technique for Key Term Extraction

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Veröffentlicht in:International Conference on Frontiers of Intelligent Computing: Theory and Applications (5. : 2016 : Bhubaneswar) Proceedings of the 5th International Conference on Frontiers in Intelligent Computing: Theory and Applications ; Volume 1
1. Verfasser: Chakraborty, Neelotpal (VerfasserIn)
Weitere Verfasser: Mukherjee, Sambit (VerfasserIn), Naskar, Ashes Ranjan (VerfasserIn), Malakar, Samir (VerfasserIn), Sarkar, Ram (VerfasserIn), Nasipuri, Mita (VerfasserIn)
Pages:5
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2017
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