A new model for failure mode and effects analysis based on k-means clustering within hesitant linguistic environment

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Veröffentlicht in:Institute of Electrical and Electronics Engineers IEEE transactions on engineering management
1. Verfasser: Duan, Chun-Yan (VerfasserIn)
Weitere Verfasser: Chen, Xu-Qi (VerfasserIn), Shi, Hua (VerfasserIn), Liu, Hu-Chen (VerfasserIn)
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Sprache:eng
Veröffentlicht: 2022
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