High Technology for Contact Problems (Mainly, Connector Contact Problems)

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Veröffentlicht in:Symposium on Reliability and Maintainability (14. : 1984 : Tokio) 14th Symposium on Reliability and Maintainability
1. Verfasser: Sano, Kazuharu (VerfasserIn)
Weitere Verfasser: Nakamura, Shigeru (VerfasserIn)
Pages:14
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1984
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100-MHz Oscilloscope Reliability Design Based on Field Data Analysis 1984 Baba, Sueo
Reliability Improvement on Attitude Director Indicator 1984 Tanaka, Hideaki
Development of a Structure for DIP-Solderable Mini Plastic IC Packages 1984 Serizawa, Koji
Evaluation Test of Firing Phenomena of Chip Type Solid Tantalum Capacitor 1984 Enomoto, Hideo
Analysis of Market Claims (Forecast of the Incidence Number of Market Claims) 1984 Fujii, Shigeki
Decreasing Soldering Defects During Assembly of Printed Circuit Boards 1984 Honda, Michiharu
Reliability and Problems Consideration of Plastic Packaged IC (Part 4) 1984 Araki, Nobuyuki
An Example of Exploratory Failure Analysis 1984 Tomikawa, Toshio
The Activity to Improve PCA's Reliability and Quality 1984 Yamamoto, Tamotsu
Development of Prep: Fault Tree Automatic Construction 1984 Ujita, Hiroshi
Preparation of Cumulative Hazard Papers and the Result of Their Trial Use 1984 Mitsuhashi, Takeshi
Field Machine Quality Data System Centering on Reliability Analysis 1984 Kameyama, Satoshi
Long Term Reliability Testing of Si Planer Transistors 1984 Kunihiro, Yuji
Reliability of Hot Carrier Injected Mosfets 1984 Mitsuhashi, Junichi
Failure Analysis of Small Relay 1984 Nagayama, Takayuki
Some Problems Concerning Reliability Testing of Electomechanical Components 1984 Kimura, Yoshihide
Software Bug Prediction of Office Automation Equipments by Experimental Regression Analysis 1984 Fukushima, Katsuhiro
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