Examples of Activities for Improving Quality in Semiconductor Purchasing - Report III

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Veröffentlicht in:Symposium on Reliability and Maintainability (16. : 1986 : Tokio) 16th Symposium on Reliability and Maintainability
1. Verfasser: Tsubota, Hideyoshi (VerfasserIn)
Weitere Verfasser: Watanabe, Yoshiaki (VerfasserIn), Yamada, Shuichi (VerfasserIn)
Pages:16
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1986
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Titel Jahr Verfasser
New Protection System for Elevators 1986 Matsubara, Kazunori
Equipment Reliability Improvement Through Analysis of Plastic Film Capacitor Faults 1986 Ryoke, Takashi
Reliability of Hicas Suspension Control System 1986 Okuyama, Yuji
Introduction and Expansion of DR in Personal Computers Attaching Importance to Marketability 1986 Haraoka, Mitsuo
Reliability Data Analysis for Repairable Systems (Using NHPP Duane Model) 1986 Iwama, Hideo
Analysis on a Cause of Rare Contact Failure in Sealed Contacts 1986 Okamoto, Hideo
A New Monitoring System for Transmitting Stations 1986 Kawai, Makoto
Reliability Evaluation of Mounted Leadless Chip Carriers 1986 Jinnouchi, Toshio
Reliability Analysis of Surveillance Test for Electric Power Plant 1986 Akutagawa, Kunio
A Highly Reliable Optical Pick-up for a Compact Disc Player 1986 Yamada, Akira
Comprehensive Means of Assuring High Reliability for Personal Computer 1986 Yoshimura, Hiroyuki
Design Reliability of the Contact Sensors and Micro-computer Control Unit for Dryers 1986 Amano, Kikuo
Bayesian Analysis of Reliability Growth of System 1986 Horigome, Michio
Report of Appraised Method of Reliability of Connectors 1986 Kanase, Yoshio
Quality and Reliability Data Collection and Analysis System in Integrated Manufacturing of Computer Hard-ware 1986 Nakamura, H.
Activity for Failure Analysis Ability Improvement as AN LSI Manufacturer - Focusing on the Detection of Failed Parts on LSI Chips 1986 Nikawa, Kiyoshi
On Determination of Spare Quantity 1986 Yanagi, Shigeru
Enhancement of Reliability of Portable Wordprocessors 1986 Matsumura, Mitsuo
The System Fuzzy Reliability for the End-use Function of the Software 1986 Mitsuhashi, Takeshi
Problems in Pressure Cooker Test 1986 Toi, K.
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