| New Protection System for Elevators
|
1986 |
Matsubara, Kazunori |
| Equipment Reliability Improvement Through Analysis of Plastic Film Capacitor Faults
|
1986 |
Ryoke, Takashi |
| Reliability of Hicas Suspension Control System
|
1986 |
Okuyama, Yuji |
| Introduction and Expansion of DR in Personal Computers Attaching Importance to Marketability
|
1986 |
Haraoka, Mitsuo |
| Reliability Data Analysis for Repairable Systems (Using NHPP Duane Model)
|
1986 |
Iwama, Hideo |
| Analysis on a Cause of Rare Contact Failure in Sealed Contacts
|
1986 |
Okamoto, Hideo |
| A New Monitoring System for Transmitting Stations
|
1986 |
Kawai, Makoto |
| Reliability Evaluation of Mounted Leadless Chip Carriers
|
1986 |
Jinnouchi, Toshio |
| Availability Evaluation Considering Spares and Maintenance Procedure
|
1986 |
Inoue, Yoshihiro |
| Reliability of Dew Sensor for VTR Use
|
1986 |
Nagaya, Naoyuki |
| Reliability Evaluation of Connector Integrated Solar Cell for Space Use
|
1986 |
Uchida, Yasunori |
| Improve on Reliability of Vacuum Insulation Panel
|
1986 |
Yamashita, Haruhisa |
| Reliability of Surface Mounting Devices Using Copper Lead Frame
|
1986 |
Koyama, Hirofumi |
| Supply & Failure Data Reliability Analysis System (2nd. Report; Applying to Vacuum Circuit Breaker)
|
1986 |
Kusano, Yosuke |
| Reliability Evaluation System of the LSI Processes
|
1986 |
Mitsuhashi, Junichi |
| Analysis of LSI Electrical-charge Accumulation Failures
|
1986 |
Maeda, Yorihumi |
| Voltage Contrast Measurement of Passivated LSIS by Slectron Beam Tester
|
1986 |
Hosoi, Hiroyuki |
| Failure Analysis of CMOS Leak Current
|
1986 |
Sanada, Masaru |
| Preliminary Evaluation of Purchased IC's Reliability
|
1986 |
Tsusumi, N. |
| Mechanism of Misalignment Failure of Liquid-Crystal Display Cells
|
1986 |
Ezawa, Masayoshi |
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