Reliability and Maintainability: The Dream of Developing Nations

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Veröffentlicht in:International Symposium on Reliability and Maintainability (20 : 1990 : Tokio) International Symposium on Reliability and Maintainability, 1990-Tokyo
1. Verfasser: MOSUGU, I. J. (VerfasserIn)
Pages:1990-
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1990
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Titel Jahr Verfasser
Reliability Prediction Methodologies 1990 PECHT, Michael
Theoretical and Practical Aspects of Drift Reliability vs. Manufacturing Yield Optimization 1990 STYBLINSKI, M. A.
Reliability of Plastic Molded ICs using Copper Wire Ball Bonding 1990 TSURUMARU, Kazuhiro
HAST (Highly Accelerated Temperature & Humidity Stress Test) under Air and Steam 1990 TOI, Keiko
Reliability Estimation Method for an LNG Terminal 1990 FUJII, Takashi
Improvement of the Water Supply Connection in Faucets 1990 OHTA, Yoshiki
On Proximity Between Geometric and Some Discrete Life Distributions 1990 CHENG, Kan
Simplified Confidence Intervals for Weibull Distributed Censored Data 1990 BENSKI, Claudio
The Maximum Likelihood Estimation of Weibull Parameters when a Failure is Suppressed by an Unknown Effect 1990 ISHIOKA, Tsunenori
Software Dependability Evaluation in Space Systems 1990 VALETTE, Veronique
Optimum Test Case Generation for Programs without Loops 1990 OHBA, Mitsuru
Estimator of Reliability and Efficiency of "Machine-Man-Environment - Operation - Maintenance" 1990 VOLKOV, B. N.
Reliability Analysis and Periodic Operation of A Warm Stand - by Redundant System 1990 SASAKI, Masafumi
IEC/TC 56 : 25 Years of International Co-operation 1990 STRANDBERG, Kjell
International Co-operation and National Activities for the "International Exchange of Authenticated Electronic Component Performance Text Data" in Japan 1990 OKAMOTO, Hideo
Reliability Improvement through Reliability Prediction 1990 Debnath, N. K.
Influence on Semiconductor Devices by the Flux Cleaning Solvent Replacing CFC 1990 MATSUSHIMA, Hiroshi
A Study of the Adhesive Strength Concerned with Power Semiconductor Electrode 1990 TAKAHASHI, Atsumi
Moisture Resistance of Flat Chip Linear Positive Temperature. Coefficient Resistors ( FCLPTCR ) and Its Evaluation within Short Time Period 1990 HOSODA, Katsuhiro
A Study on the Reliability of Soldering of the Surface Mount Device-The 2nd Report 1990 YOSHIDA, Akio
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