| IEC/TC 56 : 25 Years of International Co-operation
|
1990 |
STRANDBERG, Kjell |
| International Co-operation and National Activities for the "International Exchange of Authenticated Electronic Component Performance Text Data" in Japan
|
1990 |
OKAMOTO, Hideo |
| Reliability Improvement through Reliability Prediction
|
1990 |
Debnath, N. K. |
| Influence on Semiconductor Devices by the Flux Cleaning Solvent Replacing CFC
|
1990 |
MATSUSHIMA, Hiroshi |
| A Study of the Adhesive Strength Concerned with Power Semiconductor Electrode
|
1990 |
TAKAHASHI, Atsumi |
| Moisture Resistance of Flat Chip Linear Positive Temperature. Coefficient Resistors ( FCLPTCR ) and Its Evaluation within Short Time Period
|
1990 |
HOSODA, Katsuhiro |
| A Study on the Reliability of Soldering of the Surface Mount Device-The 2nd Report
|
1990 |
YOSHIDA, Akio |
| Strength and Reliability of Silicon Nitride Turbocharger Rotor for High Performance Automotive Engines
|
1990 |
KAWAMOTO, Hiroshi |
| In-service Degradation Material Data Base and Their Reliability Analysis of Steam Turbine Components
|
1990 |
INUKAI, Takao |
| Statistics on Thermal Properties of Carbon Phenol Composite Material
|
1990 |
EGUCHI, Akihiro |
| IRAT (Integrated Reliability Analysis Tool) a New RAMCAD Tool
|
1990 |
BERNSTEIN, Nathan |
| On Component Improvement and System Reliability Increase
|
1990 |
XIE, Min |
| Development of a Preventive Maintenance Support System for Control Rod Drive Mechanisms
|
1990 |
OHTSUKA, Hisao |
| The Techniques for Achieving Space Quality EEE Parts
|
1990 |
HAMITER, Leon |
| Assurance Technology and Liability Prevention
|
1990 |
BALL, Leslie W. |
| Navigation in the Documantation of Huge System
|
1990 |
LAC, Chidang |
| Reliability, Maintainability, Quality Assurance, and Safety Activities for the United States Space Program
|
1990 |
RODNEY, George A. |
| Some Discussion on Common Cause Failure
|
1990 |
NONAKA, Yasuıo |
| Human Error Analysis of Man-Machine Systems Using Petri Nets
|
1990 |
KOHDA, Takehisa |
| Simulation of Lifetimes and Acceleration Factors for Electromigration in IC'S
|
1990 |
UEKUSA, Genzo |
Tag hinzufügen