X-ray sources for high throughput and extreme resolutions

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Veröffentlicht in:International Symposium on Digital Industrial Radiology and Computed Tomography (9. : 2019 : Fürth) International Symposium on Digital Industrial Radiology and Computed Tomography
1. Verfasser: Espes, E. (VerfasserIn)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 2019
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Focal spot characterization of an industrial X-ray CT scanner 2019 Probst, G.
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Automatic Defect Detection for X-Ray inspection: Semantic segmentation with deep convolutional network 2019 Tokime, R. Booto
Optimization of soft X-ray tomography by compressed sensing 2019 Wu, J.
Octree CT Volume Based Reconstruction and Shape Extraction for Processing Massive X-ray Projection Data 2019 Ohtake, Y.
Iterative CT reconstruction improvement for non-destructive testing applications 2019 Escoda, J.
Implementation of a beam hardening correction method for mono material parts using a linearization technique 2019 Müller, A. M.
Determination of Metrological Structural Resolution using an Aperiodic Spatial Frequency Standard 2019 Wohlgemuth, F.
X-ray back scatter technique for additive manufacturing 2019 Zscherpel, U.
Automatic data analysis within X-ray inspection of welds 2019 Lindgren, E.
Mapping Performance of CT 2019 Brierley, N.
A Forward Projection Model for Computed Tomography Reconstruction Based on Photon Transport 2019 Alsaffer, A.
A new multi-target colored X-ray microscopy based on SEM 2019 Niu, G.
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