ELECTRO/STRESS MIGRATION FAILURE OF ALUMINUM THIN FILM

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Veröffentlicht in:Symposium on Reliability and Maintainability (19. : 1989 : Tokio) 19th Symposium on Reliability and Maintainability
1. Verfasser: NISHIKUBO, M. (VerfasserIn)
Weitere Verfasser: ONOE, M. (VerfasserIn), MIYAMOTO, K. (VerfasserIn), MAKI, N. (VerfasserIn), MATSUMOTO, H. (VerfasserIn)
Pages:19
Format: UnknownFormat
Sprache:eng
Veröffentlicht: 1989
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