Computed tomography in ordnance: measuring charge density profiles in projectile head caps

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Veröffentlicht in:Internationales Symposium über Computertomografie für die Industrielle Anwendung (3 : 1994 : Berlin) International Symposium on Computerized Tomography for Industrial Applications
1. Verfasser: Waaler, D. (VerfasserIn)
Weitere Verfasser: Odegardstuen, G. (VerfasserIn)
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Sprache:eng
Veröffentlicht: 1995
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