ULTRAFAST AXIAL SCANNING BASED ON DMD AND BINARY HOLOGRAPHY

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Bibliographische Detailangaben
Veröffentlicht in:	ASPE Winter Topical Meeting on Precision Engineering for Micro and Nanotechnology (2018 : Livermore, Calif.) ASPE 2018 Winter Topical Meeting on Precision Engineering for Micro and Nanotechnology
1. Verfasser:	Wang, D. (VerfasserIn)
Pages:	2018
Format:	UnknownFormat
Sprache:	eng
Veröffentlicht:	2019
Schlagworte:
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AUTOMATED HANDLING AND INSPECTION FOR INERTIAL CONFINEMENT FUSION CAPSULE SELECTION	2019	Boehm, K.
KEYENCE VHX DIGITAL MICROSCOPE	2019	Senkbeil, D.
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MODEL-BASED IMAGE PROCESSING AND RECONSTRUCTION FOR X-RAY CT	2019	Mohan, K.
PRECISION NON-CONTACT FIBER-OP0C DISPLACEMENT SENSOR BASED ON NEAR- FIELD SPECKLEGRAM	2019	Feng, F.
MULTISCALE PRECISION INSTRUMENTATION LABORATORY	2019	Chen, S.-C.
YASDA MICRO MACHINE	2019	Kimura, Y.
GENERAL ATOMICS: LARGEST ICF/HED TARGET SUPPLIER WORLDWIDE	2019	Huang, H.
HIGH-TECH DESIGN & MANUFACTURING EMBEDDED IN DUTCH PRECISION ECO- SYSTEM	2019	Oosterhuis, G.
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IN-SITU ULTRASENSITIVE LABEL-FREE DNA HYBRIDIZATION DETECTION USING FIBER SPECKLEGRAM	2019	Chen, W.
STRUCTURAL ELECTRONIC MATERIALS LAB	2019	Wang, Y.
NANOCOINING: LOW-COST, HIGH-THROUGHPUT NANOFAB	2019	Miller, N.
SCALABLE SUBMICRON ADDITIVE MANUFACTURING	2019	Saha, S.
DIGITAL MICROMIRROR DEVICE-BASED ULTRAFAST PULSE SHAPING FOR FEMTOSECOND LASER	2019	Chang, Y.
SON-X: COMPANY PROFILE	2019	Bulla, B.