10th Symposium on Reliability and Maintainability June 30-July 2, 1980

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Körperschaften: Symposium on Reliability and Maintainability (VerfasserIn), Nihon-Kagaku-Gijutsu-Renmei (Herausgebendes Organ)
Format: UnknownFormat
Sprache:eng
Veröffentlicht: Tokyo Union of Japanese Scientists and Engineers (JUSE) 1980
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Konferenzschrift
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Titel Jahr Verfasser
Availability for a Combat Tank System in Several Operation Models 1980 Sasaki, Yasuhiro
Software Reliability and Human Error 1980 Kanno, Ayatomo
Investigation of The Tin Whisker on Pre-Plated Brass Material (Actual Observation Using Factorial Experiments) 1980 Kitami, Tsunejiro
Reliability of Printed Wiring Board 1980 Tashiro, Michiya
Analytical Approach to Thermal Fatigue of Soldered Joints in Power Transistors 1980 Yasukawa, Akio
Time Dependent Breakdown Characteristics in Thin Si02 Films 1980 Sawada, K.
A Study on Reliability and Maintainability of Special Machine Tool for Drilling and Tapping Carburetors 1980 Furuhashi, Wataru
Critical Attach Hardware of N Launch Vehicle 1980 Nagano, Takeshi
Wear Life Prediction in Brake Friction Materials 1980 Minegishi, Harumasa
V-Belt Life Prediction 1980 Takesako, Mutsuo
The Reliability Control of the User's Computer Program 1980 Mitsuhashi, Takeshi
Reliability Assurance Activities of Parts Perchased in Cooperation with SupplierS 0000000000 00000000 ...........B592 Kinroku Shimizu, Staff Engineer 1980 Suzuki, Takao
User's Trend Analysis of Initial Quality and its Utilization 1980 Yoshida, Takahiro
MIL-HDBK-217C (Principal Revised Points in the C Version) 1980 Yasuda, Joji
Thermal Resistance Evaluation of Plastic Encapsulated Power ICs (Dependence of Junction to case Upon © Case to Ambient) 1980 Sutoh, Tamotsu
A Reliability Data Gather and Analysis Computer Program System for The Development of High Voltage Rotating Machine Insulation System 1980 Tani, Tsutomu
The Data of The Troubles of The Electric Machine and Their Analysis 1980 Shimahara, Minoru
Repeatability and Quality Assurance of Earom Memory Retention Life 1980 Azegami, Hideo
Reliability Study for 16 k Bits EPROM 1980 Iwasaki, F.
Initial Reliability of IC Memory 1980 Hirayama, Tadashi
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