DETC2020-22263 A Two-Stage Multi-Fidelity Design Optimization for K-mer-Based Pattern Recognition (KPR) in Image Processing

von Yao, Yu-Ta
Veröffentlicht in ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (2020 : Online) Proceedings of the ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference - 2020 ; Volume 11, B (2020)