Backscattering Coefficients of Electrons: A Review

von Tabata, T.
Veröffentlicht in Proceedings of the Fourteenth EGS User's Meeting in Japan, August 7 - 9, 2007, KEK, Tsukuba, Japan (2007)

Wrinkles Emerging in SiO2/Si Stack During UV Nanosecond Laser Anneal

von Karmous, I.
Veröffentlicht in ECS Meeting (239. : 2021 : Online) (11.) Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11 (2021)

Interfacial Control and Subject for Ge-CMOS

von Nishimura, T.
Veröffentlicht in Handōtai, Shuseki-Kairo-Gijutsu-74.-Shinpojiumu-kōen-ronbunshū (2010)