Dependence of Channel Hot-Electron Injection on MOSFET Structure

von KUME, H.
Veröffentlicht in Conference on Solid State Devices (13 : 1981 : Tokio) Proceedings of the 13th Conference on Solid State Devices (1982)

Soft Error Rate Analysis Model (SERAM) for Dynamic NMOS RAMs

von AOKI, M.
Veröffentlicht in Conference on Solid State Devices (13 : 1981 : Tokio) Proceedings of the 13th Conference on Solid State Devices (1982)