Basics and Current Aspects of Scanning Electron Microscopy

von Stegmann, Heiko
Veröffentlicht in International Symposium for Testing and Failure Analysis (48. : 2022 : Pasadena, Calif.) 48th International Symposium for Testing and Failure Analysis (ISTFA 2022) ; Volume 2 of 2 (2023)

Quantitative imaging electron energy-loss spectroscopy on skinned-fibre sceletal muscle preparations

von Stegmann, Heiko
Veröffentlicht 1998

FIB-SIMS in FIB-SEMs—Practical Aspects for Physical Failure Analysis

von Stegmann, Heiko
Veröffentlicht in International Symposium for Testing and Failure Analysis (48. : 2022 : Pasadena, Calif.) 48th International Symposium for Testing and Failure Analysis (ISTFA 2022) ; Volume 1 of 2 (2023)