DEFECT DETECTION TECHNIQUES IN THIS SiO2 FILMS AND THEIR APPLICATION

von Nakajima, Osaake
Veröffentlicht in Symposium on Reliability and Maintainability (8. : 1978 : Tokio) 8th Symposium on Reliability and Maintainability (1978)

The Effect of Annealing Temperature on Hot-carrier Hardness, and Acceleration Testing for Hot-carrier-induced Degradation

von Shimaya, M.
Veröffentlicht in Handōtai, Shūseki Kairo Gijutsu Shinpojiumu (36. : 1989 : Tokio) Handōtai, Shūseki Kairo Gijutsu Dai 36kai Shinpojiumu (1989)