MBIST Driven SRAM Failure Analysis Using Laser Voltage Imaging and Laser Voltage Probing

von Yang, Jessica
Veröffentlicht in International Symposium for Testing and Failure Analysis (45. : 2019 : Portland, Or.) ISTFA 2019 (2019)

V-Pulse Technique For Optical Isolation Of Latchup Triggers In Sub-14 nm Standard-Cell Logic and Memory

von Lo, William
Veröffentlicht in International Symposium for Testing and Failure Analysis (45. : 2019 : Portland, Or.) ISTFA 2019 (2019)