RTOS AWARE NON-INTRUSIVE TESTING OF CYBER-PHYSICAL SYSTEMS IN HIL (HARDWARE IN THE LOOP) ENVIRONMENT

von Scherer, Balázs
Veröffentlicht in IMEKO TC10 Conference "Testing, Diagnostics & Inspection as a Comprehensive Value Chain for Quality & Safety" (2019 : Berlin) Testing, diagnostics and inspection as a comprehensive value chain for quality and safety (2019)